Surface studies on uranium monocarbide using XPS and SIMS


Autoria(s): Asuvathraman, R; Rajagopalan, S; Ananthasivan, K; Mathews, CK; Mallya, RM
Data(s)

01/07/1995

Resumo

The air-exposed surfaces of sintered and are-melted UC samples were examined by XPS and SIMS. XPS results indicate that the surface is covered with a very thin layer of UO2 mixed with free carbon, which would have formed along with the oxide during the reaction between UC and oxygen or moisture. From the SIMS depth profile of oxygen, the thickness of the oxide layer is found to be approximately 10 nm. The SIMS oxygen images of the surface as a function of etching time reveal that the surface of UC consists of a top layer of adsorbed moisture/oxygen; this contamination layer is followed by a layer containing uranium oxide, uranium hydroxide and free carbon and then grain boundary oxide and finally bulk UC. The behaviour of sintered and are-melted samples is similar.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/37937/1/Surface_studies_on_uranium.pdf

Asuvathraman, R and Rajagopalan, S and Ananthasivan, K and Mathews, CK and Mallya, RM (1995) Surface studies on uranium monocarbide using XPS and SIMS. In: Journal of Nuclear Materials, 224 (1). 25-30 .

Publicador

Elsevier Science

Relação

http://dx.doi.org/10.1016/0022-3115(95)00036-4

http://eprints.iisc.ernet.in/37937/

Palavras-Chave #Materials Engineering (formerly Metallurgy)
Tipo

Journal Article

PeerReviewed