On generating optimal signal probabilities for random tests: A genetic approach


Autoria(s): Srinivas, M; Patnaik, LM
Data(s)

1996

Resumo

Genetic Algorithms are robust search and optimization techniques. A Genetic Algorithm based approach for determining the optimal input distributions for generating random test vectors is proposed in the paper. A cost function based on the COP testability measure for determining the efficacy of the input distributions is discussed, A brief overview of Genetic Algorithms (GAs) and the specific details of our implementation are described. Experimental results based on ISCAS-85 benchmark circuits are presented. The performance pf our GA-based approach is compared with previous results. While the GA generates more efficient input distributions than the previous methods which are based on gradient descent search, the overheads of the GA in computing the input distributions are larger. To account for the relatively quick convergence of the gradient descent methods, we analyze the landscape of the COP-based cost function. We prove that the cost function is unimodal in the search space. This feature makes the cost function amenable to optimization by gradient-descent techniques as compared to random search methods such as Genetic Algorithms.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/37434/1/075798.pdf

Srinivas, M and Patnaik, LM (1996) On generating optimal signal probabilities for random tests: A genetic approach. In: VLSI Design, 4 (3). pp. 207-215.

Publicador

Hindawi Publishing Corporation

Relação

http://www.hindawi.com/journals/vlsi/1996/075798/abs/

http://eprints.iisc.ernet.in/37434/

Palavras-Chave #Others
Tipo

Journal Article

PeerReviewed