Comparison of the effect of processing parameters and degradation on the DC and microwave properties of thin films and polycrystalline bulk high-Tc superconducting materials
Data(s) |
01/06/1993
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Resumo |
The sharp increase in microwave power loss (the reverse of what has previously been reported) at the transition temperature in high-Tc superconducting systems such as YBaCu oxide (polycrystalline bulk and thin films obtained by the laser ablation technique) and BiPbSrCaCu oxide is reported. The differences between DC resistivity ( rho ) and the microwave power loss (related to microwave surface resistance) are analysed from the data obtained by a simultaneous measurement set-up. The influence of various parameters, such as preparation conditions, thickness and aging of the sample and the probing frequency (6-18 GHz), on the variation of microwave power loss with temperature is outlined. |
Formato |
application/pdf |
Identificador |
http://eprints.iisc.ernet.in/35369/1/Effect.pdf Pragasam, R and Srinivasan, C and Murthy, VRK and Viswanathan, B and Sobhanadri, J and Satyalakshmi, KM and Hegde, MS (1993) Comparison of the effect of processing parameters and degradation on the DC and microwave properties of thin films and polycrystalline bulk high-Tc superconducting materials. In: Superconductor Science and Technology, 6 (6). pp. 402-407. |
Publicador |
Institute of Physics |
Relação |
http://iopscience.iop.org/0953-2048/6/6/003 http://eprints.iisc.ernet.in/35369/ |
Palavras-Chave | #Solid State & Structural Chemistry Unit |
Tipo |
Journal Article PeerReviewed |