Comparison of the effect of processing parameters and degradation on the DC and microwave properties of thin films and polycrystalline bulk high-Tc superconducting materials


Autoria(s): Pragasam, R; Srinivasan, C; Murthy, VRK; Viswanathan, B; Sobhanadri, J; Satyalakshmi, KM; Hegde, MS
Data(s)

01/06/1993

Resumo

The sharp increase in microwave power loss (the reverse of what has previously been reported) at the transition temperature in high-Tc superconducting systems such as YBaCu oxide (polycrystalline bulk and thin films obtained by the laser ablation technique) and BiPbSrCaCu oxide is reported. The differences between DC resistivity ( rho ) and the microwave power loss (related to microwave surface resistance) are analysed from the data obtained by a simultaneous measurement set-up. The influence of various parameters, such as preparation conditions, thickness and aging of the sample and the probing frequency (6-18 GHz), on the variation of microwave power loss with temperature is outlined.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/35369/1/Effect.pdf

Pragasam, R and Srinivasan, C and Murthy, VRK and Viswanathan, B and Sobhanadri, J and Satyalakshmi, KM and Hegde, MS (1993) Comparison of the effect of processing parameters and degradation on the DC and microwave properties of thin films and polycrystalline bulk high-Tc superconducting materials. In: Superconductor Science and Technology, 6 (6). pp. 402-407.

Publicador

Institute of Physics

Relação

http://iopscience.iop.org/0953-2048/6/6/003

http://eprints.iisc.ernet.in/35369/

Palavras-Chave #Solid State & Structural Chemistry Unit
Tipo

Journal Article

PeerReviewed