A simple method for the measurement of stress in evaporated thin films by real-time holographic interferometry
| Data(s) |
1978
|
|---|---|
| Resumo |
The properties of thin films depend to a large extent upon their mechanical stability which in turn is dependent on the intrinsic stresses developed during evaporation. This paper describes a simple method for the measurement of stresses in thin films by the use of real-time holographic interferometry. |
| Formato |
application/pdf |
| Identificador |
http://eprints.iisc.ernet.in/32461/1/simple.pdf Ramprasad, BS and Radha, TS (1978) A simple method for the measurement of stress in evaporated thin films by real-time holographic interferometry. In: Thin Solid Films, 51 (3). 335-338 . |
| Publicador |
Elsevier Science |
| Relação |
http://dx.doi.org/10.1016/0040-6090(78)90296-1 http://eprints.iisc.ernet.in/32461/ |
| Palavras-Chave | #Instrumentation and Applied Physics (Formally ISU) |
| Tipo |
Journal Article PeerReviewed |
