Testing the adhesion of thin films using real-time holographic interferometry: a simple method
| Data(s) |
1978
|
|---|---|
| Formato |
application/pdf |
| Identificador |
http://eprints.iisc.ernet.in/32297/1/test.pdf Ramprasad, BS and Radha, TS (1978) Testing the adhesion of thin films using real-time holographic interferometry: a simple method. In: Applied Optics, 17 (17). 2670-2670 . |
| Publicador |
Optical Society of America |
| Relação |
http://www.opticsinfobase.org/abstract.cfm?URI=ao-17-17-2670 http://eprints.iisc.ernet.in/32297/ |
| Palavras-Chave | #Instrumentation and Applied Physics (Formally ISU) |
| Tipo |
Editorials/Short Communications PeerReviewed |
