On the effect of stacking fault energy on the thermal activation of attractive juntions in the low-temperature creep of F.C.C. metals


Autoria(s): Prasad, YVRK; Sastry, DH; Vasu, KI
Data(s)

01/03/1970

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/28232/1/save.pdf

Prasad, YVRK and Sastry, DH and Vasu, KI (1970) On the effect of stacking fault energy on the thermal activation of attractive juntions in the low-temperature creep of F.C.C. metals. In: Scripta Metallurgica, 4 (3). pp. 219-220.

Publicador

Elsevier Science

Relação

http://dx.doi.org/10.1016/0036-9748(70)90196-1

http://eprints.iisc.ernet.in/28232/

Palavras-Chave #Materials Engineering (formerly Metallurgy)
Tipo

Journal Article

PeerReviewed