Investigation of true remnant polarization response in heterostructured artificial biferroics


Autoria(s): Chaudhuri, Ayan Roy; Krupanidhi, SB
Data(s)

01/04/2010

Resumo

Epitaxial bilayered thin films composed of ferromagnetic La0.6Sr0.4MnO3 and ferroelectric 0.7Pb (Mg1/3Nb2/3)O3-0.3(PbTiO3) were fabricated on LaAlO3 (100) substrates by pulsed laser ablation. Ferroelectric, ferromagnetic and magneto-dielectric characterizations performed earlier indicated the possible existence of strain-mediated magneto-electric coupling in these biferroic heterostructures. In order to investigate their true remnant polarization characteristics, usable in devices, room-temperature polarization versus electric field, positive-up negative-down (PUND) pulse polarization studies and remnant hysteresis measurements were carried out. The PUND and remnant hysteresis measurements revealed the significant contribution of the non-remnant component in the observed polarization hysteresis response of these heterostructures. (C) 2010 Published by Elsevier Ltd

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/27242/1/imlo.pdf

Chaudhuri, Ayan Roy and Krupanidhi, SB (2010) Investigation of true remnant polarization response in heterostructured artificial biferroics. In: Solid State Communications, 150 (13-14). pp. 660-662.

Publicador

Elsevier Science

Relação

http://dx.doi.org/10.1016/j.ssc.2009.12.023

http://eprints.iisc.ernet.in/27242/

Palavras-Chave #Materials Research Centre
Tipo

Journal Article

PeerReviewed