Reliability analysis of torsional varactor
| Contribuinte(s) |
S, Mahapatra MK, Radhakrishnan |
|---|---|
| Data(s) |
2007
|
| Resumo |
A torsional MEMS varactor with wide dynamic range, lower actuation voltage and isolation between actuation voltage and signal voltage has been proposed in C. Venkatesh et al. (2005). In this paper we address the effects of pull-in, residual stress and continuous cycling on the performance of torsional MEMS varactor. |
| Formato |
application/pdf |
| Identificador |
http://eprints.iisc.ernet.in/27152/1/1.pdf Venkatesh, C and Bhat, Navakanta (2007) Reliability analysis of torsional varactor. In: 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, JUL 11-13, 2007, Bangalore. |
| Publicador |
IEEE |
| Relação |
http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumber=4378069&queryText%3D%28%28%28Reliability%29+AND+analysis+of+torsional%29+AND+varactor%29%26openedRefinements%3D*%26matchBoolean%3Dtrue%26searchField%3DSearch+All+Text http://eprints.iisc.ernet.in/27152/ |
| Palavras-Chave | #Electrical Communication Engineering |
| Tipo |
Conference Paper PeerReviewed |
