Electrical switching and in situ Raman scattering studies on the set-reset processes in Ge-Te-Si glass
Data(s) |
27/08/2007
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Resumo |
Bulk Ge15Te83Si2 glass has been found to exhibit memory-type switching for 1 mA current with a threshold electric field of 7.3 kV/cm. The electrical set and reset processes have been achieved with triangular and rectangular pulses, respectively, of 1 mA amplitude. In situ Raman scattering studies indicate that the degree of disorder in Ge15Te83Si2 glass is reduced from off to set state. The local structure of the sample under reset condition is similar to that in the off state. The Raman results are consistent with the switching results which indicate that the Ge15Te83Si2 glass can be set and reset easily. (C) 2007 American Institute of Physics. |
Formato |
application/pdf |
Identificador |
http://eprints.iisc.ernet.in/26209/1/hyu.pdf Anbarasu, M and Asokan, S and Prusty, Sudakshina and Sood, AK (2007) Electrical switching and in situ Raman scattering studies on the set-reset processes in Ge-Te-Si glass. In: Applied Physics Letters, 91 (9). |
Publicador |
American Institute of Physics |
Relação |
http://apl.aip.org/applab/v91/i9/p093520_s1 http://eprints.iisc.ernet.in/26209/ |
Palavras-Chave | #Physics |
Tipo |
Journal Article PeerReviewed |