Off-axis field approximations for ion traps with apertures


Autoria(s): Chattopadhyay, Madhurima; Mohanty, Atanu K
Data(s)

2009

Resumo

In recent work (Int. J. Mass Spec., vol. 282, pp. 112–122) we have considered the effect of apertures on the fields inside rf traps at points on the trap axis. We now complement and complete that work by considering off-axis fields in axially symmetric (referred to as “3D”) and in two dimensional (“2D”) ion traps whose electrodes have apertures, i.e., holes in 3D and slits in 2D. Our approximation has two parts. The first, EnoAperture, is the field obtained numerically for the trap under study with apertures artificially closed. We have used the boundary element method (BEM) for obtaining this field. The second part, EdueToAperture, is an analytical expression for the field contribution of the aperture. In EdueToAperture, aperture size is a free parameter. A key element in our approximation is the electrostatic field near an infinite thin plate with an aperture, and with different constant-valued far field intensities on either side. Compact expressions for this field can be found using separation of variables, wherein the choice of coordinate system is crucial. This field is, in turn, used four times within our trap-specific approximation. The off-axis field expressions for the 3D geometries were tested on the quadrupole ion trap (QIT) and the cylindrical ion trap (CIT), and the corresponding expressions for the 2D geometries were tested on the linear ion trap (LIT) and the rectilinear ion trap (RIT). For each geometry, we have considered apertures which are 10%, 30%, and 50% of the trap dimension. We have found that our analytical correction term EdueToAperture, though based on a classical small-aperture approximation, gives good results even for relatively large apertures.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/26086/1/e.pdf

Chattopadhyay, Madhurima and Mohanty, Atanu K (2009) Off-axis field approximations for ion traps with apertures. In: International Journal of Mass Spectrometry, 288 (1-3). pp. 58-67.

Publicador

Elsevier Science.

Relação

http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6VND-4X315MS-1&_user=512776&_coverDate=12%2F31%2F2009&_rdoc=10&_fmt=high&_orig=browse&_srch=doc-info%28%23toc%236176%232009%23997119998%231540113%23FLA%23display%23Volume%29&_cdi=6176&_sort=d&_doca

http://eprints.iisc.ernet.in/26086/

Palavras-Chave #Instrumentation and Applied Physics (Formally ISU) #Supercomputer Education & Research Centre
Tipo

Journal Article

PeerReviewed