X-ray photoelectron spectroscopic studies on Se/As2S3 and Sb/As2S3 nanomultilayered film
Data(s) |
01/10/2009
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Resumo |
Photoinduced diffusion in Se/As2S3 and Sb/As2S3 nanomultilayered thin films are studied by X-ray photoelectron spectroscopy (XPS). The XPS measurements show the atomic movements during photoinduced diffusion in Se/As2S3 and Sb/As2S3 nanomultilayered film. The analysis of experimental data describes the nature of light induced changes indifferent structural units. (C) 2009 Elsevier B.V. All rights reserved. |
Formato |
application/pdf |
Identificador |
http://eprints.iisc.ernet.in/24816/1/20.pdf Naik, Ramakanta and Adarsh, KV and Ganesan, R and Sangunni, KS and Kokenyesi, S and Deshpande, Uday and Shripathi, T (2009) X-ray photoelectron spectroscopic studies on Se/As2S3 and Sb/As2S3 nanomultilayered film. In: International Symposium on Non-Oxide and New Optical Glasses, APR 20-25, 2008, Montpellier,France, pp. 1836-1839. |
Publicador |
Elsevier Science |
Relação |
http://dx.doi.org/10.1016/j.jnoncrysol.2009.05.064 http://eprints.iisc.ernet.in/24816/ |
Palavras-Chave | #Physics |
Tipo |
Conference Paper PeerReviewed |