Time-Domain Measurement of Voltage Induction by Transient EM Fields
| Data(s) |
01/03/1978
|
|---|---|
| Resumo |
An efficient measurement technique for studying the effect of transient electromagnetic fields under controlled conditions has been described. Broad-band TEM fields with a rise-time of a few nanoseconds were generated using a stripline method. Theoretical results are obtained and experimental measurements which confirm these results are described. The work will form the basis for a study of the susceptibility of digital integrated circuits and their interconnections to transient electromagnetic fields. |
| Formato |
application/pdf |
| Identificador |
http://eprints.iisc.ernet.in/24363/1/full_text_5.pdf Naito, H and Shah, Arvind V (1978) Time-Domain Measurement of Voltage Induction by Transient EM Fields. In: Transactions on Instrumentation and Measurement, 27 (1). pp. 38-42. |
| Publicador |
IEEE |
| Relação |
http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4314602&arnumber=4314614&count=32&index=10 http://eprints.iisc.ernet.in/24363/ |
| Palavras-Chave | #Electrical Communication Engineering |
| Tipo |
Journal Article PeerReviewed |
