Different phenomenological theories and their abilities to describe the interdiffusion process in a binary system during multiphase growth
Data(s) |
01/01/2009
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Resumo |
There are essentially two different phenomenological models available to describe the interdiffusion process in binary systems in the olid state. The first of these, which is used more frequently, is based on the theory of flux partitioning. The second model, developed much more recently, uses the theory of dissociation and reaction. Although the theory of flux partitioning has been widely used, we found that this theory does not account for the mobility of both species and therefore is not suitable for use in most interdiffusion systems. We have first modified this theory to take into account the mobility of both species and then further extended it to develop relations or the integrated diffusion coefficient and the ratio of diffusivities of the species. The versatility of these two different models is examined in the Co-Si system with respect to different end-member compositions. From our analysis, we found that the applicability of the theory of flux partitioning is rather limited but the theory of dissociation and reaction can be used in any binary system. |
Formato |
application/pdf |
Identificador |
http://eprints.iisc.ernet.in/19504/1/dif.pdf Ghosh, C and Paul, A (2009) Different phenomenological theories and their abilities to describe the interdiffusion process in a binary system during multiphase growth. In: Acta Materialia, 57 (2). pp. 493-502. |
Publicador |
Elsevier |
Relação |
http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TW8-4TS239M-2-7&_cdi=5556&_user=512776&_orig=search&_coverDate=01%2F31%2F2009&_sk=999429997&view=c&wchp=dGLzVtb-zSkWb&md5=d5d08f5291023ffdff220e0422c25394&ie=/sdarticle.pdf http://eprints.iisc.ernet.in/19504/ |
Palavras-Chave | #Electronic Systems Engineering (Formerly, (CEDT) Centre for Electronic Design & Technology) #Materials Engineering (formerly Metallurgy) |
Tipo |
Journal Article PeerReviewed |