Deploying Top-K specific patterns for relevance feature discovery
| Contribuinte(s) |
Hoeber, O Li, Y Huang, X |
|---|---|
| Data(s) |
2010
|
| Identificador | |
| Publicador |
IEEE |
| Relação |
DOI:10.1109/WI-IAT.2010.194 Pipanmaekaporn, Luepol, Li, Yuefeng, & Geva, Shlomo (2010) Deploying Top-K specific patterns for relevance feature discovery. In Hoeber, O, Li, Y, & Huang, X (Eds.) Proceedings of the 2010 IEEE/WIC/ACM International Conference on Web Intelligence and Intelligent Agent Technology - Workshops: 3rd International Workshop on Web Information Retrieval Support Systems (WIRSS 2010), 31 August - 3 September, 2010, Canada. |
| Fonte |
Faculty of Science and Technology; School of Information Technology |
| Palavras-Chave | #080100 ARTIFICIAL INTELLIGENCE AND IMAGE PROCESSING #Information Filtering, Pattern Mining, Relevance Feature Discovery, Text Mining |
| Tipo |
Conference Paper |
