Electrochemical pathway for the quantification of SERS enhancement factor
| Data(s) |
2014
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| Resumo |
This communication presents a new pathway for the more precise quantification of surface-enhanced Raman scattering (SERS) enhancement factor via deducing resonance Raman scattering (RRS) effect from surface-enhanced resonance Raman scattering (SERRS). To achieve this, a self-assembled monolayer of 1,8,15,22-tetraaminophthalocyanatocobalt(II) (4α-CoIITAPc) is formed on plasmon inactive glassy carbon (GC) and plasmon active GC/AuNPs surface. The surfaces are subsequently used as common probes for electrochemical and Raman (RRS and SERRS) studies. The most crucial parameters required for the quantification of SERS substrate enhancement factor (SSEF) such as real surface area of GC/AuNPs substarte and the number of 4α-CoIITAPc molecules contributing to RRS (on GC) and SERRS (on GC/AuNPs) are precisely estimated by cyclic voltammetry experiments. The present approach of SSEF quantification can be applied to varieties of surfaces by choosing an appropriate laser line and probe molecule for each surface. |
| Formato |
application/pdf |
| Identificador | |
| Publicador |
Elsevier |
| Relação |
http://eprints.qut.edu.au/78572/1/1.pdf DOI:10.1016/j.elecom.2014.10.007 Sivanesan, Arumugam, Adamkiewicz, Witold, Kalaivani, Govindasamy, Kamińska, Agnieszka, Waluk, Jacek, Hołyst, Robert, & Izake, Emad L. (2014) Electrochemical pathway for the quantification of SERS enhancement factor. Electrochemistry Communications, 49, pp. 103-106. |
| Direitos |
Copyright 2014 Elsevier This is the author’s version of a work that was accepted for publication in Electrochemistry Communications. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Electrochemistry Communications, Volume 49, 2014, DOI: 10.1016/j.elecom.2014.10.007 |
| Fonte |
School of Chemistry, Physics & Mechanical Engineering; Science & Engineering Faculty |
| Tipo |
Journal Article |
