Non-invasive depth profiling by space and time-resolved Raman spectroscopy
Data(s) |
2013
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Identificador | |
Publicador |
John Wiley and Sons Ltd. |
Relação |
DOI:10.1002/jrs.4313 Sundarajoo, Shankaran, Kiriakous, Emad, Olds, William, Cletus, Biju, Jaatinen, Esa, & Fredericks, Peter (2013) Non-invasive depth profiling by space and time-resolved Raman spectroscopy. Journal of Raman Spectroscopy, 44(7), pp. 949-956. |
Fonte |
School of Chemistry, Physics & Mechanical Engineering; Science & Engineering Faculty |
Tipo |
Journal Article |