Deterministic plasma-aided synthesis of high-quality nanoislanded nc-SiC films


Autoria(s): Cheng, Qijin; Xu, S.; Long, Jidong; Ostrikov, K.
Data(s)

2007

Resumo

Despite major advances in the fabrication and characterization of SiC and related materials, there has been no convincing evidence of the synthesis of nanodevice-quality nanoislanded SiC films at low, ultralarge scale integration technology-compatible process temperatures. The authors report on a low-temperature (400 °C) plasma-assisted rf magnetron sputtering deposition of high-quality nanocrystalline SiC films made of uniform-size nanoislands that almost completely cover the Si(100) surface. These nanoislands are chemically pure, highly stoichiometric, have a typical size of 20-35 nm, and contain small (∼5 nm) nanocrystalline inclusions. The properties of nanocrystalline SiC films can be effectively controlled by the plasma parameters.

Identificador

http://eprints.qut.edu.au/73756/

Publicador

American Institute of Physics (AIP)

Relação

DOI:10.1063/1.2731728

Cheng, Qijin, Xu, S., Long, Jidong, & Ostrikov, K. (2007) Deterministic plasma-aided synthesis of high-quality nanoislanded nc-SiC films. Applied Physics Letters, 90(17), pp. 173112-1.

Direitos

Copyright 2007 American Institute of Physics (AIP)

Fonte

School of Chemistry, Physics & Mechanical Engineering; Science & Engineering Faculty

Palavras-Chave #silicon #thin films #sputter deposition #nanofabrication #carbides
Tipo

Journal Article