Ontology-based product's reputation model
| Contribuinte(s) |
Raghaven, Vijay Hu, Xiaolin Liau, Churn-Jung Treur, Jan |
|---|---|
| Data(s) |
2013
|
| Resumo |
Different reputation models are used in the web in order to generate reputation values for products using uses' review data. Most of the current reputation models use review ratings and neglect users' textual reviews, because it is more difficult to process. However, we argue that the overall reputation score for an item does not reflect the actual reputation for all of its features. And that's why the use of users' textual reviews is necessary. In our work we introduce a new reputation model that defines a new aggregation method for users' extracted opinions about products' features from users' text. Our model uses features ontology in order to define general features and sub-features of a product. It also reflects the frequencies of positive and negative opinions. We provide a case study to show how our results compare with other reputation models. |
| Identificador | |
| Publicador |
IEEE |
| Relação |
DOI:10.1109/WI-IAT.2013.146 Abdel-Hafez, Ahmad & Xu, Yue (2013) Ontology-based product's reputation model. In Raghaven, Vijay, Hu, Xiaolin, Liau, Churn-Jung, & Treur, Jan (Eds.) Proceedings of the 2013 IEEE/WIC/ACM International Conferences on Web Intelligence (WI) and Intelligent Agent Technology (IAT), IEEE, Atlanta, Georgia, pp. 37-40. |
| Direitos |
Copyright © 2013 by The Institute of Electrical and Electronics Engineers, Inc. Copyright and Reprint Permissions: Abstracting is permitted with credit to the source. Libraries may photocopy beyond the limits of US copyright law, for private use of patrons, those articles in this volume that carry a code at the bottom of the first page, provided that the per-copy fee indicated in the code is paid through the Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923. Other copying, reprint, or republication requests should be addressed to: IEEE Copyrights Manager, IEEE Service Center, 445 Hoes Lane, P.O. Box 133, Piscataway, NJ 08855-1331. The papers in this book comprise the proceedings of the meeting mentioned on the cover and title page. They reflect the authors’ opinions and, in the interests of timely dissemination, are published as presented and without change. Their inclusion in this publication does not necessarily constitute endorsement by the editors, the IEEE Computer Society, or the Institute of Electrical and Electronics Engineers, Inc. |
| Fonte |
School of Electrical Engineering & Computer Science; Science & Engineering Faculty |
| Palavras-Chave | #Reputation model #Feature ontology #Opinion mining #Rating aggregation |
| Tipo |
Conference Paper |
