Microstructure of epitaxial YBa2Cu3O7-δ thin films on (001)-tilt Y-ZrO2 bicrystals
| Data(s) |
1994
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|---|---|
| Resumo |
The microstructures of the grain boundaries in epitaxial YBa2Cu3O7-δ thin films grown on [001]-tilt yttria-stabilized ZrO2 bicrystal substrates were characterized by TEM and at. force microscopy. The exact boundary plane geometries of the bicrystal substrates were not transferred to the films which instead had wiggling grain boundaries. [on SciFinder(R)] |
| Identificador | |
| Publicador |
Editions de Physique |
| Relação |
Alarco, J.A., Olsson, E., Ivanov, Z.G., Winkler, D., Claeson, T., Stepantsov, E.A., Lebedev, O.I., Vasiliev, A., & Kiselev, N.A. (1994) Microstructure of epitaxial YBa2Cu3O7-δ thin films on (001)-tilt Y-ZrO2 bicrystals. Editions de Physique. |
| Fonte |
Institute for Future Environments |
| Palavras-Chave | #grain boundary barium yttrium cuprate zirconia #microstructure barium yttrium cuprate yttria zirconia |
| Tipo |
Book |
