X-ray your data with Rasch
Data(s) |
2007
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Resumo |
By using the Rasch model, much detailed diagnostic information is available to developers of survey and assessment instruments and to the researchers who use them. We outline an approach to the analysis of data obtained from the administration of survey instruments that can enable researchers to recognise and diagnose difficulties with those instruments and then to suggest remedial actions that can improve the measurement properties of the scales included in questionnaires. We illustrate the approach using examples drawn from recent research and demonstrate how the approach can be used to generate figures that make the results of Rasch analyses accessible to non-specialists. |
Formato |
application/pdf |
Identificador | |
Publicador |
Shannon Research Press |
Relação |
http://eprints.qut.edu.au/28875/1/c28875.pdf http://www.iejcomparative.org/index.php Curtis, David & Boman, Peter (2007) X-ray your data with Rasch. International Education Journal, 8(2), pp. 249-259. |
Direitos |
Copyright 2007 Shannon Research Press |
Fonte |
Office of Education Research; School of Cultural & Professional Learning; Faculty of Education |
Palavras-Chave | #130303 Education Assessment and Evaluation #Rasch #Partial Credit Model #Reliability #Threshold Analysis #Differential Item Function |
Tipo |
Journal Article |