A Study on the Thermal Behavior of Fabrication Processes for Micro-accelerometer by SOI Wafers


Autoria(s): Jeong, Young-Jae; Kim, Ill-Soo; Kim, O-S; Yarlagadda, Prasad
Data(s)

2002

Identificador

http://eprints.qut.edu.au/23142/

Publicador

Elsevier Science Ltd

Relação

Jeong, Young-Jae, Kim, Ill-Soo, Kim, O-S, & Yarlagadda, Prasad (2002) A Study on the Thermal Behavior of Fabrication Processes for Micro-accelerometer by SOI Wafers. Journal of Materials Processing Technology, 130-131, pp. 680-684.

Fonte

Faculty of Built Environment and Engineering

Tipo

Journal Article