989 resultados para short survey


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Said-Nahal and colleagues report an intriguing finding of an association with HLA-DR4 independent of B27 in families with ankylosing spondylitis (AS),1 a finding highlighted by an accompanying editorial.2 The approach of studying B27 positive and B27 negative haplotypes may prove powerful in identifying further cis or trans encoded genes involved in AS. However, the reported association of DR4 with AS is quite a surprising finding given that no difference was noted in B27-DR4 haplotype frequencies in patients and ethnically matched healthy controls. Many previous studies have not reported any such association,3–9 including a similar preliminary study by the same authors.10 Although these studies were mainly case-control studies, population stratification is highly unlikely to cause a false negative finding if the effect size of the reported association with DR4 is as high as Said-Nahal and colleagues describe...

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This report presents oceanographic data supporting the detailed chemical studies in the VERTEX Particle Interceptor Trap (PIT) experiment off the central California coast. Prior to the deployment of the PITs, an oceanographic survey of the intended study area was made on R/V CAYUSE from 17 to 21 August 1980. During this cruise, twenty CTD stations (Fig. 1) were occupied in a grid centered about the PIT site selected earlier based on archival oceanographic data. During the second leg of the VERTEX experiment from 25 August to 3 September, CTO profiles were taken as time permitted. In addition, a short survey near the PITs was made on 2 September. The intent of the pre-deployment cruise was to obtain data characterizing the vertical and horizontal variability of physical and chemical properties and to map the geostrophic flow field. Toward this end, vertical profiles of salinity, temperature and dissolved oxygen were made using a Plessey 9040 CTOa profiler. Considerable effort was expended to make vertical beam attenuation profiles to

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To increase the amount of logic available to the users in SRAM-based FPGAs, manufacturers are using nanometric technologies to boost logic density and reduce costs, making its use more attractive. However, these technological improvements also make FPGAs particularly vulnerable to configuration memory bit-flips caused by power fluctuations, strong electromagnetic fields and radiation. This issue is particularly sensitive because of the increasing amount of configuration memory cells needed to define their functionality. A short survey of the most recent publications is presented to support the options assumed during the definition of a framework for implementing circuits immune to bit-flips induction mechanisms in memory cells, based on a customized redundant infrastructure and on a detection-and-fix controller.