Non-Destructive Evaluation of Ion-Implanted Semiconductor Thin Films Using Photothermal Deflections Spectroscopy

Materials and equipment which fail to achieve the design requirements or projected life due to undetected defects may require expensive repair or early replacement. Such defects may also be the cause of unsafe conditions or catastrophic unexpected failure, and will lead to loss of revenue due to plant shutdown. Non-Destructive Evaluation (NDE) / Non Destructive Testing (NDT) is used for the examination of materials and components without changing or destroying their usefulness. NDT can be applied to each stage of a system’s construction, to monitor the integrity of the system or structure throughout its life.

Non-destruct|ve testing of non-metallic materials using microwaves

The motivatitni for" the present work is from .a project sanctioned by TSRO. The work involved the development of a quick and reliable test procedure using microwaves, for tflue inspection of cured propellant samples and a method to monitor the curing conditions of propellant mix undergoing the curing process.Normal testing CHE the propellant samples involvecuttimg a piece from each carton and testing it for their tensile strength. The values are then compared with standard ones and based on this result the sample isaccepted or rejected. The tensile strength is a measure ofdegree of cure of the propellant mix. But this measurementis a destructive procedure as it involves cutting of the sample. Moreover, it does not guarantee against nonuniform curing due to power failure, hot air-line failure,operator error etc. This necessitated the need for the development of a quick and reliable non-destructive test procedure.