69 resultados para Fault Currents


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The verification of information flow properties of security devices is difficult because it involves the analysis of schematic diagrams, artwork, embedded software, etc. In addition, a typical security device has many modes, partial information flow, and needs to be fault tolerant. We propose a new approach to the verification of such devices based upon checking abstract information flow properties expressed as graphs. This approach has been implemented in software, and successfully used to find possible paths of information flow through security devices.