1 resultado para light microscopy

em Universidade Complutense de Madrid


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Hollow, cylindrical, prismatic light guides (CPLGs) are optical components that, using total internal reflection (TIR), are able to transmit high-diameter light beams in daylight and artificial lighting applications without relevant losses. It is necessary to study the prism defects of their surfaces to quantify the behavior of these optical components. In this Letter, we analyze a CPLG made of a transparent dielectric material. Scanning electron microscopy (SEM) and the topographic optical profilometry by absorption in fluids (TOPAF) imaging technique are conducted to determine if there are defects in the corners of the prisms. A model for light guide transmittance that is dependent on prism defects is proposed. Finally, a simulation and an experimental study are carried out to check the validity of the proposed model.