6 resultados para Gene Transfer Techniques

em Cambridge University Engineering Department Publications Database


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Liquid crystal lasers offer wide, continuous tuneability across the visible and near-infrared (450-850 nm). Compared to conventional tuneable laser technology, liquid crystal lasers are highly compact and have simple and scalable manufacturability. Their ability to emit multiple simultaneous emissions of arbitrarily selectable wavelength also gives them functional advantages over competing technologies. This paper describes Förster transfer techniques that have enabled this extended continuously tunable emission range, whilst maintaining a common pump source. © 2012 OSA.

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Ions generated during combustion have been used in three ways to give qualitative combustion information. Langmuir type probes have been inserted into the combustion chamber opposite the spark plug location. The centre electrode of the sparking plug itself has been used to produce an ionisation signal from the slightly ionised gases remaining after the flame front has departed. The spark discharge at ignition time has been used as an anemometer.

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In the field of flat panel displays, the current leading technology is the Active Matrix liquid Crystal Display; this uses a-Si:H based thin film transistors (TFTs) as the switching element in each pixel. However, under gate bias a-Si:H TFTs suffer from instability, as is evidenced by a shift in the gate threshold voltage. The shift in the gate threshold voltage is generally measured from the gate transfer characteristics, after subjecting the TFT to prolonged gate bias. However, a major drawback of this measurement method is that it cannot distinguish whether the shift is caused by the change in the midgap states in the a-Si:H channel or by charge trapping in the gate insulator. In view of this, we have developed a capacitance-voltage (C-V) method to measure the shift in threshold voltage. We employ Metal-Insulator-Semiconductor (MIS) structures to investigate the threshold voltage shift as they are simpler to fabricate than TFTs. We have investigated a large of number Metal/a-Si:H/Si3N4/Si+n structures using our C-V technique. From, the C-V data for the MIS structures, we have found that the relationship between the thermal energy and threshold voltage shift is similar to that reported by Wehrspohn et. al in a-Si:H TFTs (J Appl. Phys, 144, 87, 2000). The a-Si:H and Si3N4 layers were grown using the radio-frequency plasma-enhanced chemical vapour deposition technique.

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Numerical methods based on the Reynolds Averaged Navier-Stokes (RANS) and Large Eddy Simulation (LES) equations are applied to the thermal prediction of flows representative of those found in and around electronics systems and components. Low Reynolds number flows through a heated ribbed channel, around a heated cube and within a complex electronics system case are investigated using linear and nonlinear LES models, hybrid RANS-LES and RANS-Numerical-LES (RANS-NLES) methods. Flow and heat transfer predictions using these techniques are in good agreement with each other and experimental data for a range of grid resolutions. Using second order central differences, the RANS-NLES method performs well for all simulations. © 2011 Elsevier Inc.

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The prediction of turbulent oscillatory flow at around transitional Reynolds numbers is considered for an idealized electronics system. To assess the accuracy of turbulence models, comparison is made with measurements. A stochastic procedure is used to recover instantaneous velocity time traces from predictions. This procedure enables more direct comparison with turbulence intensity measurements which have not been filtered to remove the oscillatory flow component. Normal wall distances, required in some turbulence models, are evaluated using a modified Poisson equation based technique. A range of zero, one and two equation turbulence models are tested, including zonal and a non-linear eddy viscosity models. The non-linear and zonal models showed potential for accuracy improvements.

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Many visual datasets are traditionally used to analyze the performance of different learning techniques. The evaluation is usually done within each dataset, therefore it is questionable if such results are a reliable indicator of true generalization ability. We propose here an algorithm to exploit the existing data resources when learning on a new multiclass problem. Our main idea is to identify an image representation that decomposes orthogonally into two subspaces: a part specific to each dataset, and a part generic to, and therefore shared between, all the considered source sets. This allows us to use the generic representation as un-biased reference knowledge for a novel classification task. By casting the method in the multi-view setting, we also make it possible to use different features for different databases. We call the algorithm MUST, Multitask Unaligned Shared knowledge Transfer. Through extensive experiments on five public datasets, we show that MUST consistently improves the cross-datasets generalization performance. © 2013 Springer-Verlag.