Trace organic analysis : a new frontier in analytical chemistry : proceedings of the 9th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Maryland, April 10-13, 1978 /


Autoria(s): Materials Research Symposium (9th : 1978 : Gaithersburg, Md.); Chesler, Stephen N.; Hertz, Harry S.
Data(s)

03/05/1979

Resumo

Includes bibliographical references and indexes.

Mode of access: Internet.

Formato

gfv

gfv

Identificador

http://hdl.handle.net/2027/mdp.39015004562883

http://hdl.handle.net/2027/mdp.39015077587817

Idioma(s)

eng

Publicador

Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,

Direitos

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Palavras-Chave #Trace elements
Tipo

text