Characterization of spatial–temporal patterns in dynamic speckle sequences using principal component analysis


Autoria(s): López Alonso, José Manuel; Grumel, Eduardo; Cap, Nelly Lucía; Trivi, Marcelo; Rabal, Héctor; Alda Serrano, Javier
Data(s)

01/12/2016

Resumo

Abstract. Speckle is being used as a characterization tool for the analysis of the dynamics of slow-varying phenomena occurring in biological and industrial samples at the surface or near-surface regions. The retrieved data take the form of a sequence of speckle images. These images contain information about the inner dynamics of the biological or physical process taking place in the sample. Principal component analysis (PCA) is able to split the original data set into a collection of classes. These classes are related to processes showing different dynamics. In addition, statistical descriptors of speckle images are used to retrieve information on the characteristics of the sample. These statistical descriptors can be calculated in almost real time and provide a fast monitoring of the sample. On the other hand, PCA requires a longer computation time, but the results contain more information related to spatial–temporal patterns associated to the process under analysis. This contribution merges both descriptions and uses PCA as a preprocessing tool to obtain a collection of filtered images, where statistical descriptors are evaluated on each of them. The method applies to slow-varying biological and industrial processes.

Formato

application/pdf

Identificador

http://eprints.ucm.es/38122/1/characterization%20of%20spatial_SPIE_2016.pdf

Idioma(s)

en

Publicador

SPIE

Relação

http://eprints.ucm.es/38122/

http://dx.doi.org/10.1117/1.OE.55.12.121705

10.1117/1.OE.55.12.121705

Project No. TEC2013-40442

Direitos

info:eu-repo/semantics/openAccess

Palavras-Chave #Optica #Optoelectrónica #Láseres
Tipo

info:eu-repo/semantics/article

PeerReviewed