Surface modifications on Teflon FEP and Mylar C induced by a low energy electron beam: a Raman and FTIR spectroscopic study


Autoria(s): Chinaglia, D. L.; Constantino, CJL; Aroca, R. F.; Oliveira, O. N.
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

01/01/2002

Resumo

The surface modifications induced on Teflon FEP and Mylar C polymer films by a low energy electron beam are probed using Raman and FTIR spectroscopy. The electron beam, which does not affect the Mylar C, surface, may break the copolymer chain into its monomers degrading the Teflon FEP surface. For Mylar C the electron beam decreases the roughness of the polymer surface. This difference in behavior may explain recent results in which the surface modifications investigated by measuring the second crossover energy shift in the electronic emission curve differed for the two polymers (Chinaglia et al [1]). In addition, the Raman data showed no evidence of carbon formation for either polymer samples, which is explained by the fact that only a low energy electron beam is used.

Formato

577-582

Identificador

http://dx.doi.org/10.1080/10587250210474

Molecular Crystals and Liquid Crystals. Abingdon: Taylor & Francis Ltd, v. 374, p. 577-582, 2002.

1058-725X

http://hdl.handle.net/11449/36963

10.1080/10587250210474

WOS:000175887000087

Idioma(s)

eng

Publicador

Taylor & Francis Ltd

Relação

Molecular Crystals and Liquid Crystals

Direitos

closedAccess

Palavras-Chave #electron beam irradiation #Raman spectroscopy
Tipo

info:eu-repo/semantics/article