Successful application can only be achieved through reliable knowledge discovery: an Introduction to RIKD 2010


Autoria(s): Dai, Honghua; Liu, James; Smirnov, Evgueni
Contribuinte(s)

[Unknown]

Data(s)

01/01/2010

Resumo

RIKD 2010 is the Third International Workshop on Reliability Issues in Knowledge Discovery. This paper provides an introduction to the workshop. It summarizes the main workshop features and provides a formulation of the field of reliable knowledge discovery.

Identificador

http://hdl.handle.net/10536/DRO/DU:30067586

Idioma(s)

eng

Publicador

IEEE

Relação

http://dro.deakin.edu.au/eserv/DU:30067586/dai-successfulapplicationchair-2010.pdf

http://www.dx.doi.org/10.1109/ICDMW.2010.213

Direitos

2010, IEEE

Palavras-Chave #international workshops #knowledge Discovery #data mining
Tipo

Conference Paper