X-ray diffraction characterisation of nanoparticle size and shape distributions : application to bimodal distributions

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Autoria(s): Armstrong, N.; Kalceff, W.; Cline, J.P.; Bonevich, J.E.; Lynch, P.A.; Tang, C.C.; Thompson, S.

Contribuinte(s)	[Unknown]
Data(s)	01/01/2004
Identificador	http://hdl.handle.net/10536/DRO/DU:30052437
Idioma(s)	eng
Publicador	[The Conference]
Palavras-Chave	#Bayesian/Maximum entropy #Markov Chain Monte Carlo (MCMC) #SRM #XRD
Tipo	Conference Paper