Structural characterization of supported nanocrystalline ZnO thin films prepared by dip-coating


Autoria(s): CASANOVA, J. R.; HEREDIA, E. A.; BOJORGE, C. D.; CANEPA, H. R.; KELLERMANN, G.; Craievich, Aldo Felix
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

20/10/2012

20/10/2012

2011

Resumo

Nanocrystalline ZnO thin films prepared by the sol-gel dip-coating technique were characterized by grazing incidence X-ray diffraction (GIXD), atomic force microscopy (AFM), X-ray reflectivity (XR) and grazing incidence small-angle X-ray scattering (GISAXS). The structures of several thin films subjected to (i) isochronous annealing at 350, 450 and 550 degrees C, and (ii) isothermal annealing at 450 degrees C during different time periods, were characterized. The studied thin films are composed of ZnO nanocrystals as revealed by analysing several GIXD patterns, from which their average sizes were determined. Thin film thickness and roughness were determined from quantitative analyses of AFM images and XR patterns. The analysis of XR patterns also yielded the average density of the studied films. Our GISAXS study indicates that the studied ZnO thin films contain nanopores with an ellipsoidal shape, and flattened along the direction normal to the substrate surface. The thin film annealed at the highest temperature, T = 550 degrees C, exhibits higher density and lower thickness and nanoporosity volume fraction, than those annealed at 350 and 450 degrees C. These results indicate that thermal annealing at the highest temperature (550 degrees C) induces a noticeable compaction effect on the structure of the studied thin films. (C) 2011 Elsevier B.V. All rights reserved.

Brazilian Synchrotron Light Laboratory (LNLS)

LNLS

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

FAPESP

SECyT

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

CAPES/SECyT

CNPq/CONICET

Consejo Nacional de Investigaciones Científicas y Técnicas de Argentina (CONICET)

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

CNPq (PROSUL)

ANPCyT

Agencia Nacional de Promoción Científica y Tecnológica (ANPCyT)

CONICET

Consejo Nacional de Investigaciones Científicas y Técnicas de Argentina (CONICET)

YPF Foundation

YPF Foundation

Identificador

APPLIED SURFACE SCIENCE, v.257, n.23, p.10045-10051, 2011

0169-4332

http://producao.usp.br/handle/BDPI/29034

10.1016/j.apsusc.2011.06.136

http://dx.doi.org/10.1016/j.apsusc.2011.06.136

Idioma(s)

eng

Publicador

ELSEVIER SCIENCE BV

Relação

Applied Surface Science

Direitos

restrictedAccess

Copyright ELSEVIER SCIENCE BV

Palavras-Chave #ZnO #Nanostructured thin films #XR #GISAXS #X-RAY-SCATTERING #Chemistry, Physical #Materials Science, Coatings & Films #Physics, Applied #Physics, Condensed Matter
Tipo

article

original article

publishedVersion