Identification of models using failure rate and mean residual life of doubly truncated random variables


Autoria(s): Sunoj, S M; Sankaran, P G
Data(s)

25/07/2014

25/07/2014

06/08/2002

Resumo

In this paper, we study the relationship between the failure rate and the mean residual life of doubly truncated random variables. Accordingly, we develop characterizations for exponential, Pareto 11 and beta distributions. Further, we generalize the identities for fire Pearson and the exponential family of distributions given respectively in Nair and Sankaran (1991) and Consul (1995). Applications of these measures in file context of lengthbiased models are also explored

Statistical Papers 45, 97-109 (2004)

Cochin University of Science and Technology

Identificador

http://dyuthi.cusat.ac.in/purl/4276

Idioma(s)

en

Publicador

Springer

Palavras-Chave #Failure rate #Mean Residual Life #Length biased models
Tipo

Article