Corrigendum: Variable temperature electrochemical strain microscopy of Sm-doped ceria (2013 Nanotechnology 24 145401)

Autoria(s): Kumar, A.; Jesse, S.; Morozovska, A.; Eliseev, E.; Tebano, A.; Yang, N.; Kalinin, S. V.
Data(s)

28/02/2014
Identificador

http://pure.qub.ac.uk/portal/en/publications/corrigendum-variable-temperature-electrochemical-strain-microscopy-of-smdoped-ceria-2013-nanotechnology-24-145401(bb1be331-fd64-4c85-8630-3d07d9f2b043).html

http://dx.doi.org/10.1088/0957-4484/25/8/089501
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Kumar , A , Jesse , S , Morozovska , A , Eliseev , E , Tebano , A , Yang , N & Kalinin , S V 2014 , ' Corrigendum: Variable temperature electrochemical strain microscopy of Sm-doped ceria (2013 Nanotechnology 24 145401) ' Nanotechnology , vol 25 , no. 8 , 089501 . DOI: 10.1088/0957-4484/25/8/089501
Tipo

article
Acesso ao item digital