A Fabry-Perot Refractometer for Chemical Vapor Sensing by Solid-Phase Microextraction


Autoria(s): St-Gelais, R.; Mackey, G.; Saunders, J.; Zhou, J.; Leblanc-Hotte, A.; Poulin, A.; J.A. Barnes, J.A.; Loock, Hans-Peter; Brown, R. S.; Peter, Y.-A.
Data(s)

14/03/2016

14/03/2016

14/03/2016

Resumo

The contour lithography method [1] is used to improve the fabrication yield of previously demonstrated [2] microfluidic Fabry-Perot (FP) refractive index (RI) sensors. The sensors are then coated with polydimethylsiloxane (PDMS) based polymers to detect vapor analytes by solid-phase microextraction (SPME). Preliminary characterization of devices coated with two different polymers and exposed to xylenes vapors yields a maximum sensitivity of 0.015 nm/ppm and a detection limit below 120 ppm.

Identificador

2160-5033

DDOI:10.1109/OMEMS.2011.6031012

http://hdl.handle.net/1974/14123

Idioma(s)

en

Palavras-Chave #Chemical Sensors #Fabry-Perot #Microfluidics #Microoptics #Optical Sensors #Optical Device Fabrication
Tipo

Article