Dielectronic recombination in highly charged He-like ions
| Data(s) |
01/05/2003
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| Resumo |
We have determined resonant strengths of the KLn (2 less than or equal to n less than or equal to 5) resonances for helium-like Ti ions and (3 less than or equal to n less than or equal to 5) resonances for helium-like Fe ions. The results were obtained using the Tokyo electron beam ion trap. Characteristic X-rays from both dielectronic recombination and radiative recombination were detected as the electron beam energy was scanned through the resonances. (C) 2003 Elsevier Science B.V. All rights reserved. |
| Identificador |
http://dx.doi.org/10.1016/S0168-583X(02)01950-X http://www.scopus.com/inward/record.url?scp=0037656400&partnerID=8YFLogxK |
| Idioma(s) |
eng |
| Direitos |
info:eu-repo/semantics/restrictedAccess |
| Fonte |
O'Rourke , B , Currell , F , Kuramoto , H , Li , Y M , Ohtani , S , Tong , X M & Watanabe , H 2003 , ' Dielectronic recombination in highly charged He-like ions ' Nuclear Instruments & Methods in Physics Research - Section B: Beam Interactions with Materials and Atoms , vol 205 , pp. 378-381 . DOI: 10.1016/S0168-583X(02)01950-X |
| Palavras-Chave | #/dk/atira/pure/subjectarea/asjc/2500/2508 #Surfaces, Coatings and Films #/dk/atira/pure/subjectarea/asjc/3100/3105 #Instrumentation #/dk/atira/pure/subjectarea/asjc/3100/3110 #Surfaces and Interfaces |
| Tipo |
article |
