Response Surface Modeling and Optimisation for Reliable Electronic Products


Autoria(s): Stoyanov, S.; Bailey, C.
Contribuinte(s)

Xie, Xiaoming

Liu, Johan

Data(s)

2002

Resumo

The aim of integrating computational mechanics (FEA and CFD) and optimization tools is to speed up dramatically the design process in different application areas concerning reliability in electronic packaging. Design engineers in the electronics manufacturing sector may use these tools to predict key design parameters and configurations (i.e. material properties, product dimensions, design at PCB level. etc) that will guarantee the required product performance. In this paper a modeling strategy coupling computational mechanics techniques with numerical optimization is presented and demonstrated with two problems. The integrated modeling framework is obtained by coupling the multi-physics analysis tool PHYSICA - with the numerical optimization package - Visua/DOC into a fuJly automated design tool for applications in electronic packaging. Thermo-mechanical simulations of solder creep deformations are presented to predict flip-chip reliability and life-time under thermal cycling. Also a thermal management design based on multi-physics analysis with coupled thermal-flow-stress modeling is discussed. The Response Surface Modeling Approach in conjunction with Design of Experiments statistical tools is demonstrated and used subsequently by the numerical optimization techniques as a part of this modeling framework. Predictions for reliable electronic assemblies are achieved in an efficient and systematic manner.

Formato

application/pdf

Identificador

http://gala.gre.ac.uk/786/1/786.pdf

Stoyanov, S. and Bailey, C. (2002) Response Surface Modeling and Optimisation for Reliable Electronic Products. In: The Fifth International IEEE Symposium on High Density Packaging and Component Failure Analysis in Electronics Manufacturing. Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 49-57. ISBN 0780398238

Idioma(s)

en

Publicador

Institute of Electrical and Electronics Engineers, Inc.

Relação

http://gala.gre.ac.uk/786/

Palavras-Chave #QA76 Computer software #TK Electrical engineering. Electronics Nuclear engineering
Tipo

Conference Proceedings

PeerReviewed