Studies of anions from sputtering III: The K-41 background in (CaF3-)-Ca-41 measurement by AMS


Autoria(s): X.L. Zhao; A.E. Litherland; J. Eliades; W.E. Kieser; Q. Liu
Data(s)

2010

Identificador

http://210.72.146.199/handle/361006/2020

http://www.irgrid.ac.cn/handle/1471x/131981

Idioma(s)

英语

Fonte

X.L. Zhao,A.E. Litherland,J. Eliades,W.E. Kieser,Q. Liu.Studies of anions from sputtering III: The K-41 background in (CaF3-)-Ca-41 measurement by AMS.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2010,268(7-8):816-819

Palavras-Chave #Superhalogen anions #Chemical sputtering #Isobar discrimination #PbF2 matrix
Tipo

期刊论文