Measurement of Cavity Loss and Quasi-Fermi-Level Separation for Fabry-Perot Semiconductor Lasers
| Data(s) |
2003
|
|---|---|
| Resumo |
A fitting process is used to measure the cavity loss and the quasi-Fermi-level separation for Fabry- Perot semiconductor lasers. From the amplified spontaneous emission (ASE) spectrum, the gain spectrum and single-pass ASE obtained by the Cassidy method are applied in the fitting process. For a 1550nm quantum well InGaAsP ridge waveguide laser, the cavity loss of about ～24cm~(-1) is obtained. A fitting process is used to measure the cavity loss and the quasi-Fermi-level separation for Fabry- Perot semiconductor lasers. From the amplified spontaneous emission (ASE) spectrum, the gain spectrum and single-pass ASE obtained by the Cassidy method are applied in the fitting process. For a 1550nm quantum well InGaAsP ridge waveguide laser, the cavity loss of about ～24cm~(-1) is obtained. 于2010-11-23批量导入 zhangdi于2010-11-23 13:07:29导入数据到SEMI-IR的IR Made available in DSpace on 2010-11-23T05:07:29Z (GMT). No. of bitstreams: 1 4956.pdf: 366621 bytes, checksum: a2aecb0295dbb18b36db8e9b5951421c (MD5) Previous issue date: 2003 国家重点基础研究发展规划资助项目（No. G2 366 5） School of Physics Science and Technology, Lanzhou University;Institute of Semiconductors, The Chinese Academy of Sciences 国家重点基础研究发展规划资助项目（No. G2 366 5） |
| Identificador | |
| Idioma(s) |
英语 |
| Fonte |
Han Chunlin;Liu Ruixi;Guo Weihua;Yu Lijuan;Huang Yongzhen.Measurement of Cavity Loss and Quasi-Fermi-Level Separation for Fabry-Perot Semiconductor Lasers,半导体学报,2003,24(8):789-793 |
| Palavras-Chave | #光电子学 |
| Tipo |
期刊论文 |
