An Improved Driving Circuit for Thermo-Optical Switch to Improve the Reliability of Thermo-Optical Switch Matrix


Autoria(s): Li Yuntao; Chen Shaowu; Yu Jinzhong
Data(s)

2005

Resumo

The influence of the heaters on the reliability of the thermo-optic (TO) switch matrix is analyzed and an improved driving circuit based on the analyzed results is designed and fabricated. The circuit can improve the reliability of the switch matrix device from 78.87% to 97.04% for a 4×4 optical switch device with a simplified tree structure. The simulation and experimental results show the circuit can provide suitable driving current for TO switch matrix.

The influence of the heaters on the reliability of the thermo-optic (TO) switch matrix is analyzed and an improved driving circuit based on the analyzed results is designed and fabricated. The circuit can improve the reliability of the switch matrix device from 78.87% to 97.04% for a 4×4 optical switch device with a simplified tree structure. The simulation and experimental results show the circuit can provide suitable driving current for TO switch matrix.

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国家自然科学基金重大基金项目,973项目,863项目

Institute of Semiconductors,Chinese Academy of Sciences

国家自然科学基金重大基金项目,973项目,863项目

Identificador

http://ir.semi.ac.cn/handle/172111/17193

http://www.irgrid.ac.cn/handle/1471x/103234

Idioma(s)

英语

Fonte

Li Yuntao;Chen Shaowu;Yu Jinzhong.An Improved Driving Circuit for Thermo-Optical Switch to Improve the Reliability of Thermo-Optical Switch Matrix,电子器件,2005,28(1):158-160

Palavras-Chave #光电子学
Tipo

期刊论文