The status, limits and countermeasures in the development of the silicon microelectronics industry
Data(s) |
2004
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Resumo |
In this paper.. the status and limits in the development of the silicon microelectronics industry are presented briefly. The key countermeasures given are use of the new structure materials and the new device structures. In this paper.. the status and limits in the development of the silicon microelectronics industry are presented briefly. The key countermeasures given are use of the new structure materials and the new device structures. zhangdi于2010-03-29批量导入 Made available in DSpace on 2010-03-29T06:06:32Z (GMT). No. of bitstreams: 1 2424.pdf: 543289 bytes, checksum: 47d110f69c4f4342973bcbf9f51f1a9e (MD5) Previous issue date: 2004 Chinese Inst Elect.; IEEE Beijing Sect.; IEEE Elect Devices Soc.; IEEE EDS Beijing Chapter.; IEEE Solid-State Circuits Soc.; IEEE SSCS Beijing Chapter.; Japan Soc Appl Phys.; IEE Elect Div.; URSI Commiss D.; Inst Elect Engineers Korea.; Natl Nat Sci Fdn China.; Beijing Municipal Bureau Ind Dev.; Peking Univ. Chinese Acad Sci, Inst Semicond, Microelect R&D Ctr, Beijing 100083, Peoples R China Chinese Inst Elect.; IEEE Beijing Sect.; IEEE Elect Devices Soc.; IEEE EDS Beijing Chapter.; IEEE Solid-State Circuits Soc.; IEEE SSCS Beijing Chapter.; Japan Soc Appl Phys.; IEE Elect Div.; URSI Commiss D.; Inst Elect Engineers Korea.; Natl Nat Sci Fdn China.; Beijing Municipal Bureau Ind Dev.; Peking Univ. |
Identificador | |
Idioma(s) |
英语 |
Publicador |
IEEE 345 E 47TH ST, NEW YORK, NY 10017 USA |
Fonte |
Liu, ZL .The status, limits and countermeasures in the development of the silicon microelectronics industry .见:IEEE .2004 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY,345 E 47TH ST, NEW YORK, NY 10017 USA ,2004,VOLS 1- 3 PROCEEDINGS: 255-257 |
Palavras-Chave | #微电子学 #silicon microelectronics #CMOS #theoretic limit #technologic limit #economic limit |
Tipo |
会议论文 |