Simple reflection technique for measuring the linear electro-optic coefficient of the polymer thin films


Autoria(s): Shi W; Fang CS; Pan QW; Meng FQ; Gu QT; Xu D; Chen GJ; Yu JZ
Data(s)

2000

Resumo

The simple reflection technique is usually used to measure the linear electro-optic (EO) coefficient (Pockels coefficient) in the development of EO polymer thin films. But there are some problems in some articles in the determination of the phase shift between the s and p light modes of a laser beam waveguided into the polymer film while a modulating voltage is applied across the electrodes, and different expressions for the linear EO coefficient measured have been given in these articles. In our research, more accurate expression of the linear EO coefficient was deduced by suitable considering the phase shift between the s and p light modes. The linear EO coefficients of several polymer thin films were measured by reflection technique, and the results of the Linear EO coefficient calculated by different expressions were compared. The limit of the simple reflection technique for measuring the linear EO coefficient of the polymer thin films was discussed.

Identificador

http://ir.semi.ac.cn/handle/172111/12706

http://www.irgrid.ac.cn/handle/1471x/65323

Idioma(s)

中文

Fonte

Shi W; Fang CS; Pan QW; Meng FQ; Gu QT; Xu D; Chen GJ; Yu JZ .Simple reflection technique for measuring the linear electro-optic coefficient of the polymer thin films ,ACTA PHYSICA SINICA,2000,49(2):262-266

Palavras-Chave #半导体物理 #POLED POLYMER #CHROMOPHORES
Tipo

期刊论文