Investigation of the errors of thickness and refractive index in manufacturing Gires-Tournois interferometer negative-dispersion mirrors


Autoria(s): Yan-zhi Wang(王胭脂); Jian-da Shao; Wei-li Zhang; Chao-yang Wei; Jian-bin Huang; Yun-xia Jin; Zheng-xiu Fan
Data(s)

2009

Identificador

http://ir.siom.ac.cn/handle/181231/6542

http://www.irgrid.ac.cn/handle/1471x/12976

Idioma(s)

中文

Fonte

Yan-zhi Wang, Jian-da Shao, Wei-li Zhang, Chao-yang Wei, Jian-bin Huang, Yun-xia Jin, Zheng-xiu Fan,.Investigation of the errors of thickness and refractive index in manufacturing Gires-Tournois interferometer negative-dispersion mirrors .Journal of Optics A: Pure and Applied Optics,2009,11:

Tipo

期刊论文