Damage on HfO2/SiO2 high-reflecting coatings under single and multiple Nd:YAG laser pulse irradiation


Autoria(s): Weidong Gao; Tao Wang; Yuanan Zhao; Jianda Shao
Data(s)

2005

Resumo

The single- and multi-shot damage behaviors of HfO2/SiO2 high-reflecting (HR) coatings under Nd:YAG laser exposure were investigated. Fundamental aspects of multi-shot laser damage, such as the instability due to pulse-to-pulse accumulation of absorption defect and structural defect effect, and the mechanism of laser induced defect generation, are considered. It was found in multi-shot damage, the main factors influencing laser-induced damage threshold (LIDT) are accumulation of irreversible changes of structural defects and thermal stress that induced by thermal density fluctuations.

Identificador

http://ir.siom.ac.cn/handle/181231/4374

http://www.irgrid.ac.cn/handle/1471x/12764

Idioma(s)

英语

Fonte

Weidong Gao;Tao Wang;Yuanan Zhao;Jianda Shao.,Chin. Opt. Lett.,2005,3(3):179-180

Palavras-Chave #光学薄膜 #thin films #310.6870 #thin films #other properties
Tipo

期刊论文