Investigation of the influence of the aberration induced by a plane interface on STED microscopy

Autoria(s): Deng SH(邓素辉); Liu L(刘力); Cheng Y(程亚); Li RX(李儒新); Xu ZZ(徐至展)
Data(s)

2009
Identificador

http://ir.siom.ac.cn/handle/181231/6441

http://www.irgrid.ac.cn/handle/1471x/9954
Idioma(s)

英语
Fonte

邓素辉,刘力,程亚,李儒新,徐至展.Investigation of the influence of the aberration induced by a plane interface on STED microscopy.Optics Express,2009,17:1714-1725
Palavras-Chave #光学
Tipo

期刊论文
Acesso ao item digital