A spectroscopic method for determining thickness of quartz wave plate

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Autoria(s): Weiwei Feng; Lihuang Lin; Ligang Chen; Huafeng Zhu; 李儒新; 徐至展

Data(s)	2006
Identificador	http://ir.siom.ac.cn/handle/181231/754 http://www.irgrid.ac.cn/handle/1471x/9732
Idioma(s)	英语
Fonte	Weiwei Feng;Lihuang Lin;Ligang Chen;Huafeng Zhu;李儒新;徐至展 .,Chin. Opt. Lett.,2006,4(12):705-708
Tipo	期刊论文