The magnetic and structure properties of room-temperature ferromagnetic semiconductor (Ga,Mn)N


Autoria(s): 张富强; 陈诺夫; Liu XL; Liu ZK; Yang SY; Chai CL
Data(s)

2004

Resumo

Diluted magnetic semiconductor (Ga,Mn)N were prepared by the implantation of Mn ions into GaN/Al2O3 substrate. Clear X-ray diffraction peak from (Ga,Mn)N is observed. It indicates that the solid solution (Ga,Mn)N phase was formed with the same lattice structure as GaN and different lattice constant. Magnetic hysteresis-loops of the (Ga,Mn)N were obtained at room temperature (293 K) with the coercivity of about 2496.97 A m(-1). (C) 2003 Elsevier B.V. All rights reserved.

Identificador

http://dspace.imech.ac.cn/handle/311007/33817

http://www.irgrid.ac.cn/handle/1471x/2757

Idioma(s)

英语

Fonte

Journal of Crystal Growth.2004,262(1-4):287-289

Palavras-Chave #X-Ray Diffraction #Ion Beam Deposition #Gan/Al2O3 #Ferromagnetic Materials #Implanted Gan #Injection
Tipo

期刊论文