Exchange bias in strained SrRuO3 thin films


Autoria(s): Sow, Chanchal; Pramanik, AK; Kumar, Anil PS
Data(s)

2014

Resumo

Recently, it was found that the ferromagnetic SrRuO3 when combined with another ferromagnet in thin film form gives rise to exchange bias (EB) effect. However, we observed EB in single, strained, SrRuO3 thin films grown on diamagnetic LaAlO3 (100) substrates. It displays the training effect, which essentially confirms EB. The temperature dependence of the EB reveals the blocking temperature to be around similar to 75 K. The strength of the exchange bias decreases with the increase in thickness of the film. We observe tensile strain in the out of plane direction. Further, the presence of in-plane compressive strain is observed through asymmetric reciprocal space mapping. Finally, we find a direct link between strain and EB. The evolution of strain with thickness matches well with the nature of scaled EB. It has been shown earlier by first principle calculations that this strain can induce EB in thin films. (C) 2014 AIP Publishing LLC.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/50575/1/jou_app_phy_116-19_2014.pdf

Sow, Chanchal and Pramanik, AK and Kumar, Anil PS (2014) Exchange bias in strained SrRuO3 thin films. In: JOURNAL OF APPLIED PHYSICS, 116 (19).

Publicador

AMER INST PHYSICS

Relação

http://dx.doi.org/ 10.1063/1.4902312

http://eprints.iisc.ernet.in/50575/

Palavras-Chave #Physics
Tipo

Journal Article

PeerReviewed