Enhanced dielectric response of ZrO2 upon Ti doping and introduction of O vacancies


Autoria(s): Dutta, Gargi; Hembram, KPSS; Rao, G Mohan; Waghmare, Umesh V
Data(s)

01/01/2008

Resumo

We determine the electronic properties and dielectric response of zirconia (ZrO2) with oxygen vacancies (O vacancies) and Ti doping using first-principles density functional theory calculations based on pseudopotentials and a plane wave basis. We find significantly enhanced static dielectric response in zirconia with Ti doping and introduction of oxygen vacancies. Softening of phonon modes are responsible for the enhanced dielectric response of doped samples compared to pure zirconia.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/26290/1/34.pdf

Dutta, Gargi and Hembram, KPSS and Rao, G Mohan and Waghmare, Umesh V (2008) Enhanced dielectric response of ZrO2 upon Ti doping and introduction of O vacancies. In: Journal of Applied Physics, 103 (1).

Publicador

American Institute of Physics

Relação

http://jap.aip.org/japiau/v103/i1/p016102_s1

http://eprints.iisc.ernet.in/26290/

Palavras-Chave #Instrumentation and Applied Physics (Formally ISU)
Tipo

Journal Article

PeerReviewed