Microstructural characterization of ultrafine-grain interstitial-free steel by X-ray diffraction line profile analysis


Autoria(s): Sarkar, Apu; Bhowmik, Ayan; Suwas, Satyam
Data(s)

01/03/2009

Resumo

This paper highlights the microstructural features of commercially available interstitial free (IF) steel specimens deformed by equal channel angular pressing (ECAP) up to four passes following the route A. The microstructure of the samples was studied by different techniques of X-ray diffraction peak profile analysis as a function of strain (epsilon). It was found that the crystallite size is reduced substantially already at epsilon=2.3 and it does not change significantly during further deformation. At the same time, the dislocation density increases gradually up to epsilon=4.6. The dislocation densities estimated from X-ray diffraction study are found to correlate very well with the experimentally obtained yield strength of the samples.

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/19208/1/1.pdf

Sarkar, Apu and Bhowmik, Ayan and Suwas, Satyam (2009) Microstructural characterization of ultrafine-grain interstitial-free steel by X-ray diffraction line profile analysis. In: Applied Physics A-Materials Science & Processing, 94 (4). pp. 943-948.

Publicador

springer

Relação

http://www.springerlink.com/content/p18u01747706426k/

http://eprints.iisc.ernet.in/19208/

Palavras-Chave #Materials Engineering (formerly Metallurgy)
Tipo

Journal Article

PeerReviewed